Display Process

Outputs standard video test signals for visual inspection or connected AOI equipment. The system checks line defects, color defects and luminance variation. It supports LVDS, eDP, MIPI and other panel interfaces.

• Standard solid-color, gradient and grid test patterns
• Signal specifications tailored to each panel interface
• AOI connection for automatic defect judgment

Screens for early failures by operating panels continuously for a set period. Multi-level, multi-sided racks process several panels at the same time.

• Early-defect screening through extended continuous operation
• Multi-level, multi-sided rack configuration for parallel processing
• Optional stress testing with configurable temperature and voltage

Combines data download and demura correction in one process. The system writes firmware, gamma and timing data to the panel driver IC. Camera measurements are used to correct luminance and color variation across the panel.

• Driver IC firmware, gamma and timing-data download
• Camera-based luminance and color-coordinate measurement and correction
• Improved OLED and LCD display uniformity